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Ion beam analysis
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1	Florida State University Research directions John D. Fox Acceleretor Laboratory • Nuclear Astrophysics Hope College Hope College Ion Beam Analysis Laboratory Add to Reading List Source URL: 2016.lecmeeting.org Language: English - Date: 2016-08-15 15:00:37
2	One-dimensional carrier profiling of blanket and confined semiconducting structures Promoter: Prof. Dr. Ir. W. Vandervorst Contact and daily advisor: Dr. Ir. J. Bogdanowicz () Required backgroun Add to Reading List Source URL: www.montefiore.ulg.ac.be Language: English - Date: 2016-06-08 02:28:36 Chemistry Semiconductor device fabrication Mass spectrometry Matter Analysis Materials science Thin film deposition Coatings Sputtering Secondary ion mass spectrometry Ion beam Semiconductor
3	NUMERICAL ANALYSIS CORRESPONDING WITH EXPERIMENT IN COMPACT BEAM SIMULATOR FOR HEAVY ION INERTIAL FUSION DRIVER T. Kikuchi1, Y. Sakai2, T. Komori1, J. Hasegawa2, K. Horioka2, K. Takahashi1, T. Sasaki1, Nob. Harada1 1 Nag Add to Reading List Source URL: ifsa15.org Language: English - Date: 2015-09-03 20:23:23
4	Positron annihilation lifetime measurement and X-ray analysis on energetic heavy ion beam irradiated polycrystalline tungsten 1* Add to Reading List Source URL: www-amdis.iaea.org Language: English - Date: 2014-11-10 05:12:14
5	MEETINGS, WORKSHOPS AND SEMINARS CONFERENCES • 13th International Conference on “Ion Beam Analysis –IBA-13”, Lisbon, Portugal, July27 – August 1, 1997. Add to Reading List Source URL: www.itn.pt Language: Portuguese - Date: 2011-08-04 11:59:25
6	Characterization of the elemental distribution in Li batteries electrodes by means of ion beam analysis Raquel Gonzalez Arrabal Instituto de Fusión Nuclear, Universidad Politécnica de Madrid, Spain The development of Add to Reading List Source URL: www.taka.jaea.go.jp Language: English - Date: 2015-04-06 22:46:09
7	FRAUNHOFER-INSTITUT FÜR I nte g rierte S y ste m e un d B aue l e m entete c hno l o g ie I I S B FAILURE ANALYSIS AND Add to Reading List Source URL: www.iisb.fraunhofer.de Language: English - Date: 2015-06-09 04:45:02 Scanning capacitance microscopy Characterization Electron microscope Scanning probe microscopy Failure analysis Transmission electron microscopy Focused ion beam Scanning electron microscope Energy-dispersive X-ray spectroscopy Scientific method Science Electron microscopy
8	Focused Ion Beam Services Nanostructuring, Failure Analysis, & Rapid IC-Prototyping FhG IISB supports you in processing nanosized structures and helps you to shorten time to market for your ASICs. Focused Ion Beam (FIB) Add to Reading List Source URL: www.iisb.fraunhofer.de Language: English - Date: 2015-06-08 13:41:23 Science Semiconductor device fabrication Thin film deposition Focused ion beam Ion beam Electron microscope Transmission electron microscopy Failure analysis Fib Scientific method Physics Electron microscopy
9	F R A U N H O F E R I N S T I T U T E F O R I N T E G R AT E D S Y S T E M S A N D D E V I C E T E C H N O L O G Y 1 1 Add to Reading List Source URL: www.iisb.fraunhofer.de Language: English - Date: 2015-06-08 12:51:01 Microscopy Semiconductor device fabrication Mechanical failure Physics of failure Failure analysis Focused ion beam Electron microscope Optical microscope Scanning SQUID microscope Scientific method Science Electron microscopy
10	PDF Document Add to Reading List Source URL: esref2015.sciencesconf.org Language: English - Date: 2015-03-16 05:41:32 Materials science Microtechnology Survival analysis Semiconductors Reliability engineering Reliability IMEC Focused ion beam Microelectromechanical systems Technology Science Semiconductor device fabrication

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